di/dt TEST SYSTEM

  • Test systems for quaranteeing di/dt strength of breakdown test.

di/d TESTER [MOS-FET, DIODE]

GST610Z
GST610Z

GST610Z has been designed to seek and judge di/dt characteristic with software by using reverse recovery waveform of MOS-FETs and diodes or break waveform with digital oscilloscope. It has OPEN/SHORT test and driver check functions to improve reliability.

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di/d TESTER [MOS-FET, DIODE]

GSTM410Z
GSTM410Z

GSTM410Z has been designed to seek and judge di/dt characteristic with software by using reverse recovery waveform of MOS-FETs and diodes or break waveform with digital oscilloscope. It has OPEN/SHORT test and driver check functions to improve reliability.

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INDUCTIVE LOAD TESTER [MOS-FET, DIODE]

GSTMLT310Z
GSTMLT310Z

GSTMLT310Z integrates di/dt measurement and inductive load measurement in one system. Measurement is carried out with the exclusive measurement terminal to consider waveform characteristics.

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tester

PRODUCT INFORMATION


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