STATIC CHARACTER TEST SYSTEM

  • Test systems corresponded to high voltage and high current.

SEMICONDUCTOR TEST SYSTEM / INDUCTIVE LOAD TESTER
[MOS-FET, IGBT, DIODE]

CHT2020ZA/LVNJ20ZFCA
CHT2020ZA_LVNJ20ZFCA

This system can carry out DC and inductive load test at measurement unit of overhead mechanism in cosideration of wafer measurement with prober by continuance.
It has hish-sppeed power supply break function by the protection circuit in head box at unusual waveform detection with inductive load test.

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SEMICONDUCTOR TEST SYSTEM / SWITCHING TIME TEST SYSTEM [TRANSISTOR, MOS-FET, DIODE]

CHT3050Z/SWL1050Z
CHT3050Z_SWL1050Z

CHT3050Z/SWL1050Z has been designed to evaluate a wafer which is able to measure DC and switching characteristics at once.
This system is equipped with a press control unit to control by measurement program.
An oscilloscope for checking waveforms is built in and users can check it at any time.

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SEMICONDUCTOR TEST SYSTEM [MOS-FET, IGBT, DIODE]

CHTDV1030Z
CHTDV1030Z

CHTDV1030Z is the multiple system to carry out DC and thermal resistance measurement at one time.
Measurement items can combine freely by the program for better efficient device evaluation.

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SEMICONDUCTOR TEST SYSTEM [MOS-FET, IGBT, THYRISTOR, DIODE, ZENER DIODE]

CHTDV3010ZZ
CHTDV3010ZZ

CHTDV3010ZZ has forcing ability of 3000V/1000A for DC measurement, 300A for thermal resistance measurement, which is better forcing ability than CHTDV1030Z.
This tester has the scanner function of 30 pins to measure multi-element device.

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SEMICONDUCTOR TEST SYSTEM [TRANSISTOR, MOS-FET, IGBT, DIODE]

CHTH1010Z
CHTH1010ZZ

This tester is an automatic test system, designed to measure the DC characteristics of transistors, MOS-FETs, IGBTs and diodes with high voltage (9.99kV/2mA) and high current (999A) at high accuracy and high speed.

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SURGE TESTER [TRANSISTOR, DIODE]

SZD10T
SZD10T

SZD10T has been designed to guarantee for surge tolerance of diode or thyristor with 10,000A forcing at maximum.
This system also has thermal resistance measurement function.

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SEMICONDUCTOR TEST SYSTEM [MOS-FET, IGBT, THYRISTOR, DIODE]

CHT3012ZZ
CHT3012ZZ

CHT3012ZZ is DC measurement tester for power semiconductor which has 3kV-1200A forcing ability.
Measurement table in the picture is heat stage and it is possible to rise up temperature to 200℃.

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SEMICONDUCTOR TEST SYSTEM [MOS-FET, IGBT, DIODE]

CHT1050Z
CHT1050Z

CHT1050Z is DC measurement tester with a built-in multi-pin scanner to measure multi-element module.
Measurement is carried out with an application by setting device to jig unit (left part in the picture).
The information and measurement result of the device are displayed with the application.

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IGBT WAVEFORM TEST SYSTEM [IGBT]

WFT3000
WFT3000

WFT3000 is waveform test system which is designed to measure reverse breakdown voltage of IGBT and leak current of 3000V.
Measurement head on the picture is the combination with 36 pin programmable scanner.
It can correspond to demanded measurement head.

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PRODUCT INFORMATION


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