DIODE TEST SYSTEM

  • CATS diode testers rushed of new products such as surge testers that are necessary for diode test.

IFSM TESTER [DIODE, SCR, TRIAC]

IFSM40ZZRP
IFSM40ZZRP

IFSM40ZZRP is designed to guarantee tolerance of IFSM which is non-repetitive maximum current of diode by forcing and measuring peak voltage value at the forcing. This system is able to carry out constant measurement 2 elements at maximum.

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VFR TESTER [DIODE]

VFR510Z
VFR510Z

VFR510Z has been designed to measure forward recovery voltage and time with digital oscilloscope by letting current flow forward direction of diode at high speed. The speed of diF/dt is guaranteed 500A/µs.

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ESD TEST SYSTEM [DIODE]

CV-30KB
CV-30KB

CV-30KB has been designed to perform ESD test by forcing at high voltage 30kV, then the tester guarantees device's deterioration by leak current measurement or breakdown voltage measurement. Leak voltage is measured before and after forcing surge pulse and check deterioration by the change of device.

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SUPER HIGH VOLTAGE LEAKAGE TESTER [ZENER DIODE]

CSZD50K
CSZD50K

CSZD50K is the test system to carry out leak measurement with high voltage 50kV

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TRR TESTERyDIODEz

TRR-M1A
TRR-M1A

TRR-M1A is tester that IF and IR current are selectable from 100mA or 1A. Measurement range is from 20ns to 80.000µs.

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SEMICONDUCTOR REVERSE RECOVERY TIME TESTER [DIODE]

TRR-D2A
TRR-D2A

TRR-D2A has been designed to measure diode reverse recovery time (Trr) with oscilloscope. IF and IR are variable to 2A.

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TRR TESTER [DIODE]

TRR610B
TRR610B

TRR610B has a wide setting range from 0.5A to 10A for IF/IR current. This tester has a structure to connect with a heater unit for high temperature measurement.

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PRODUCT INFORMATION


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