STATIC CHARACTER TEST SYSTEM

  • Test systems corresponded to high voltage and high current.

SEMICONDUCTOR TEST SYSTEM
[TRABSISTOR, MOS-FET, ZENER DIODE, PHOTO TRANSISTOR]

CCT510NA
CCT510NA

CCT510NA is DC tester for production line which can measure up to 3 stations. Also, computer can control 8 testers at maximum, it means that 24 stations can be controlled by one computer.

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SEMICONDUCTOR TEST SYSTEM [TRANSISTOR, MOS-FET, DIODE]

CAT1050M
CAT1050M

The series of CAT testers have been designed to measure DC characteristics and have all types of Voltage : 500V-1500V, Current : 10A-50A. And models which more than 1500V and 50A are acceptable by option. Measurement station has 3 channels (at the maximum), and by setting in scanner makes it acceptable to multiple-pin devices.

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SEMICONDUCTOR TEST SYSTEM
[TRANSISTOR, MOS-FET, IGBT, THYRISTOR, DIODE]

CAT2050SP
CAT2050SP

The series of CAT testers have been designed to measure DC characteristics and have all types of Voltage : 500V-1500V, Current : 10A-50A. And models which more than 1500V and 50A are acceptable by option. Measurement station has 3 channels (at the maximum), and by setting in scanner makes it acceptable to multiple-pin devices.

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SEMICONDUCTOR TEST SYSTEM
[TRANSISTOR, MOS-FET, IGBT, DIODE]

CATL2010Z
CATL2010Z

CATL2010Z has designed to measure wafer by probe. This test system can measure DC characteristics and inductive load test at one place. It can manage measurement program and result together. It also has wafer map function.

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SEMICONDUCTOR TEST SYSTEM [MOS-FET, IGBT, THYRISTOR, DIODE]

CHT3012ZZ
CHT3012ZZ

CHT3012ZZ is DC measurement tester for power semiconductor which has 3kV-1200A forcing ability. Measurement table in the picture is heat stage and it is possible to rise up temperature to 200℃.

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IGBT WAVEFORM TEST SYSTEM [IGBT]

WF3000
WF3000

WF3000 is waveform test system which is designed to measure reverse breakdown voltage of IGBT and leak current of 3000V. Measurement head on the picture is the combination with 36 pin programmable scanner. It can correspond to demanded measurement head.

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REGULATOR TEST SYSTEM FOR 4-TERMINAL
[VOLTAGE REGULATOR, SHUNT REGULATOR]

CCR03PE
CCR03PE

CCR03PE is 2 parallel measurement system for voltage regulator and shunt regulator with high accuracy (0.05%).

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tester

PRODUCT INFORMATION


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