OTHER TESTERS

  • Guarantees with measurement value included super junction and jig.

FUNCTION TESTER

FCT1200
FCT1200

This is the function tester for the control board.
This tester can use for various type of boards by pin programmable function.
In addition, the tester can interface with an auto-handler for mass production system.

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IPS ΔVF /TEMPERATURE TEST SYSTEM [INTELLIGENT POWER SWITCH]

DVIPS-H20P
DVIPS-H20P

This system has been designed to measure thermal resistance and temperature of surface of intelligent power switch.
This system has 2 parallel measurement for better productivity.

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TRIAC dv/dt TESTER [TRIAC]

DVDT810Z
DVDT810Z

This is the tester for checking off voltage rising point [(dv/dt)c] which is that Triac does not turn off based on the waveform of critical rate of rise of commutating voltage method at EIAJ ED4521.

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di/dt TEST SYSTEM [THYRISTOR, TRIAC]

DIDT1250Z
DIDT1250Z

DIDT1250Z is the tester for checking whether triac and thyristor can withstand critical on-state current by forcing waveform conforming to the critical rate of rise of on-state current test method (EIAJ ED4521-(4.2.8)).
diT/dt can be changed by setting variable coil and VD voltage.

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AGING TEST SYSTEM [IGBT]

SCTS60Z
SCTS60Z

SCTS60Z is the aging test system to observe deterioration of IGBT module. This system judges the deterioration by forcing power of 6kW at maximum and measures leakage current before and after forcing.
D.U.T. transportation and heat-up system are in one unit in the system and pass devices and fail devices are stored to the discharge area.

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SHORT CIRCUIT TEST SYSTEM [IGBT]

SCT1010ZZ
SCT1010ZZ

SCT1010ZZ has been designed to test energy tolerance of IGBT device at short circuit.
Energy amount is calculated by digital oscilloscope waveform which is corresponded with software.
Also, it has preventive function not to break D.U.T for safety.

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QG TESTER [IGBT, MOS-FET]

QGI660Z
QGI660Z

QGI660Z has been designed to measure gate capacitance of MOS-FET and IGBT.
Oscilloscope is mounted inside of tester, and it is linked with software to show measurement waveform on the software display for better efficient data management.

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ISOLATION TESTER

TACI6000
TACI6000

By applying high voltage to the semiconductor packages, this tester guarantees the isolation voltage.

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ISOLATION TESTER for 10 DEVICES

TARY4000
TARY4000

TARY4000 is the corresponded model to multi-device of TAC series.
It can measure 10 devices simultaneously to improve productivity.

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IGBT CAPACITY TEST SYSTEM [IGBT]

CPS300B
CPS300B

This system measures the capacity of IGBTs with externally connected capacitance meter.
A computer manages measurement conditions and results, and enables data collection with EXCEL.

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CAPACITY TEST SYSTEM [MOS-FET, IGBT]

CPS2000
CPS2000

CPS2000 has 2000V forcing voltage which is the highest voltage value in capacity measurement systems (CPS series) .
Control part and measurement part are separated in this system.

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PRSM TEST SYSTEM [ZENER DIODE]

PRSM430Z
PRSM430Z

PRSM430Z has been designed to measure clamp tolerance of zener diode by triangular wave forcing method (JEITA ED-4511B 4.2.5).

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TEMPERATURE CONTROL BOX

HU-350B
HU-350B

HU-350B can heat a device TO-220 or TO-3P to 350℃.
Surface to contact with device heat radiation is covered with ceramic for keeping isolation.

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STANDARD TEST SOCKET of CATS

3-Terminal/Diode/Curve tracer
TEST SOCKET

There are 3 kinds of test sockets that for TO-220/TO-3P and for diode 2 terminals, and for curve tracer.
Heat tolerance is 300℃for TO-220/TO-3P, 220℃ for diode and vurve tracer.

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HIGH WITHSTAND VOLTAGE SOCKET For TO-3P

3PS-01/3PS-02
3PS-01_3PS-02

3PS-01/3PS-02 are test sockets for TO-3P. The lead insert part of these sockets are separated.
The sockets have 5kV of tolerance and 250A of pulse current at maximum.

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JIG for CHIP TEST

JGWF-03/JGWF-04H
JGWF-03_JGWF-04H

There are manual jig that turn ON/OFF the contace by raising and lowering the toggle clamp.
There are equipped with XYZ rotaty stage, and the chip can be corrected to the proper position and measured.
JGWF-04H also has heater function (maximum 180℃) on the stage, it is possible to measure with the chip overheated.

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POWER RELAY (4 contact transfer) [20A 250V AC]

CR4040-12
CR4040-12

20A for A contact and B contact. Tolerance is AC2.5kV/DC3.5kV between contacts.

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PRODUCT INFORMATION


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