DIODE TEST SYSTEM

  • CATS diode testers rushed of new products such as surge testers that are necessary for diode test.

IFSM TESTER [DIODE]

IFSM-10ZZRPB
IFSM-10ZZRPB

IFSM-10ZZRPB is designed to guarantee tolerance of IFSM by forcing IFSM constantly in 1000A maximum and measure peak voltage value. It corresponds up to 2 elements measurement of diode with constant alternation measurement.

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IFSM TESTER [DIODE]

IFSM-45ZZ
IFSM-45ZZ

IFSM-45ZZ has been designed to guarantee tolerance of IFSM by forcing IFSM which is 4500A at maximum (It is only single measurement). Half-wave time range is settable from 1.0ms to 11.0ms.

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IFSM TESTER [DIODE]

IFSM-50Z
IFSM-50Z

By applying IFSM at 500A (at the maximum) and performing peak voltage and measurement, this tester guarantees strength of IFSM.

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IFSM TEST SYSTEM [DIODE]

IFRM530Z
IFRM530Z

IFRM530Z has been designed to guarantee tolerance of IFSM by calculating IFRM which is diode forward surge current.

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VFR TESTER [DIODE]

VFR510Z
VFR510Z

VFR510Z has been designed to measure forward recovery voltage and time with digital oscilloscope by letting current flow forward direction of diode at high speed. The speed of diF/dt is guaranteed 500A/us.

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HARD BREAKDOWN TESTER [DIODE]

SZ410A
SZ410A

This test system verifies the surge breakdown of diodes by applying a fixed surge current in the reverse direction for a fixed interval of time to diode terminals.

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ESD TEST SYSTEN [DIODE]

CV-30KB
CV-30KB

CV-30KB has been designed to perform ESD test by forcing at high voltage 30kV, then the tester guarantees device's deterioration by leak current measurement or breakdown voltage measurement. Leak voltage is measured before and after forcing surge pulse and check deterioration by the change of device.

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TRR TESTER [DIODE]

TRR-M1A
TRR-M1A

TRR-M1A is tester that IF and IR current are selectable from 100mA or 1A. Measurement range is from 20ns to 80.000μs.

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SEMICONDUCTOR REVERSE RECOVERY TIME TESTER [N/P DIODE]

TRRZ-N05M/TRR-PN100A/TRDI-PN100
tester

PRODUCT INFORMATION


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