BNI5000RQ

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BIAS TESTER
【IGBT】

BNI5000RQ is a bias tester applying power to semiconductor devices for extended　period of time in a high-temperature environment to check the degradation　performance status. The 12 device storage spaces enable heat-up to 200°C and power application for up to 999 hours.

BNI5000RQdownload
Requirement

Contact by phone click here.
+81-186-35-2102
※Please call between 9 a.m. and 5 p.m. on weekdays