tester INDUCTIVE LOAD TESTER (Included leakage current test)
【MOS-FET】
LVNI20ZFCC is inductive load tester for MOS-FET, which system is for a measurement with a wafer condition. This system is equipped with high speed interception circuits at
a chip destruction, and has IGSS and IDSS measurement
circuits for leakage measurement before and after L load
measurement.
Contact by phone click here.
+81-186-35-2102
※Please call between 9 a.m. and 5 p.m. on weekdays