CV-30KB

  • Published
  • Modified
  • Author tester
  • テストシステム Diode test system

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     Check of the Product/Test of the reliablity

ESD TEST SYSTEM
【DIODE】

CV-30KB has been designed to perform ESD test by forcing at
high voltage 30kV, then the tester guarantees device’s
deterioration by leak current measurement or breakdown voltage measurement. Leak voltage is measured before and after forcing surge pulse and check deterioration by the change of device.

CV-30KBDownload
Requirement

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